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Standard Test Probe B With 50N Force For IEC61032 Figure 2 And IEC 60529 IP2X

Standard Test Probe B With 50N Force For IEC61032 Figure 2 And IEC 60529 IP2X

MOQ: 1
preço: Customized
Embalagem padrão: Carton Box
Período de entrega: 3 Days
Método do pagamento: T/T
Capacidade de abastecimento: 100 sets per month
Informações detalhadas
Place of Origin
China
Marca
Sinuo
Certificação
Calibration Certificate(Cost Additional )
Model Number
SN2210-2T
Test Standard:
IEC 61032 and IEC 60529 IP2X
Applied Figure:
Figure 2
Handle Material:
Nylon
Probe Material:
Stainless Steel
Force:
0-50N
Accessory:
M6 Thread And Banana Clip
Descrição do produto

 

Standard Test Probe B With 50N Force For IEC61032 Figure 2 And IEC 60529 IP2X

 

 

 

Product information:

 

This test probe complies with the requirements of Probe B as specified in IEC 61032 and IEC 60529 IP2X. It features an M6 threaded hole at the end of the handle, allowing it to be connected to a force gauge for precise testing applications.

 

Technical parameters:

 

Parameters /Model SN2210-2T
Name Standard test probe with force
Joint 1 30±0.2 (mm)
Joint 2 60±0.2 (mm)
Finger length 80±0.2 (mm)
Fingertip to baffle 180±0.2 (mm)
Cylindrical R2±0.05 (mm)
Spherical S4±0.05 (mm)
Fingertip cutting bevel angle 37o 0 -10’
Fingertip taper 14 o 0 -10’
Test finger diameter Ф12 0 -0.05 (mm)
A-A Section diameter Ф50(mm)
A-A Section width 20±0.2
Baffle diameter Ф75±0.2(mm)
Baffle thickness 5±0.5(mm)
Built-in Force 0-50N force, resolution of 5N
 
Standard Test Probe B With 50N Force For IEC61032 Figure 2 And IEC 60529 IP2X 0

produtos
Detalhes dos produtos
Standard Test Probe B With 50N Force For IEC61032 Figure 2 And IEC 60529 IP2X
MOQ: 1
preço: Customized
Embalagem padrão: Carton Box
Período de entrega: 3 Days
Método do pagamento: T/T
Capacidade de abastecimento: 100 sets per month
Informações detalhadas
Place of Origin
China
Marca
Sinuo
Certificação
Calibration Certificate(Cost Additional )
Model Number
SN2210-2T
Test Standard:
IEC 61032 and IEC 60529 IP2X
Applied Figure:
Figure 2
Handle Material:
Nylon
Probe Material:
Stainless Steel
Force:
0-50N
Accessory:
M6 Thread And Banana Clip
Minimum Order Quantity:
1
Preço:
Customized
Packaging Details:
Carton Box
Delivery Time:
3 Days
Payment Terms:
T/T
Supply Ability:
100 sets per month
Descrição do produto

 

Standard Test Probe B With 50N Force For IEC61032 Figure 2 And IEC 60529 IP2X

 

 

 

Product information:

 

This test probe complies with the requirements of Probe B as specified in IEC 61032 and IEC 60529 IP2X. It features an M6 threaded hole at the end of the handle, allowing it to be connected to a force gauge for precise testing applications.

 

Technical parameters:

 

Parameters /Model SN2210-2T
Name Standard test probe with force
Joint 1 30±0.2 (mm)
Joint 2 60±0.2 (mm)
Finger length 80±0.2 (mm)
Fingertip to baffle 180±0.2 (mm)
Cylindrical R2±0.05 (mm)
Spherical S4±0.05 (mm)
Fingertip cutting bevel angle 37o 0 -10’
Fingertip taper 14 o 0 -10’
Test finger diameter Ф12 0 -0.05 (mm)
A-A Section diameter Ф50(mm)
A-A Section width 20±0.2
Baffle diameter Ф75±0.2(mm)
Baffle thickness 5±0.5(mm)
Built-in Force 0-50N force, resolution of 5N
 
Standard Test Probe B With 50N Force For IEC61032 Figure 2 And IEC 60529 IP2X 0

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